2D analysis of functional stress degradations on power...

Microelectronics International 2004 / 08 Vol. 21; Iss. 2

2D analysis of functional stress degradations on power VDMOS transistor

Beydoun, B., Zoaeter, M., Alaeddine, A., Rachidi, I., Bahsoun, F., Charlot, J‐J., Charles, J‐P.
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Volume:
21
Language:
english
Journal:
Microelectronics International
DOI:
10.1108/13565360410531971
Date:
August, 2004
File:
PDF, 388 KB
english, 2004
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