Development of the yield-based process capability index, C py , to flexibly and accurately measure conformance
Kenyon, George N, Sale, R. Samual, Hozak, Kurt, Chiou, PaulVolume:
33
Language:
english
Journal:
International Journal of Quality & Reliability Management
DOI:
10.1108/IJQRM-01-2014-0011
Date:
August, 2016
File:
PDF, 319 KB
english, 2016