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SPIE Proceedings [SPIE International Conference on Manufacturing Automation - Hong Kong, Hong Kong (Saturday 1 August 1992)] International Conference on Manufacturing Automation - Real-time pattern recognition by joint-Fourier transform correlation
Poon, Ting-Chung, Pieper, Ronald J., Asundi, Anand K., Tan, S. T.Volume:
1713
Year:
1993
Language:
english
DOI:
10.1117/12.138486
File:
PDF, 250 KB
english, 1993