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SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Interferometry: Applications - Interferometer for measurement of absolute refractive index and thickness
Alexandrov, Serguei A., Chernyh, Igor V., Pryputniewicz, Ryszard J., Brown, Gordon M., Jueptner, Werner P. O.Volume:
1756
Year:
1993
Language:
english
DOI:
10.1117/12.140813
File:
PDF, 131 KB
english, 1993