SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Advanced Optical Manufacturing and Testing IV - Diffraction efficiency of recurrent image of multiple holograms
Ni, Xiao-Wu, Wang, Hong-Yi, Lu, Jian, He, Anzhi, Doherty, Victor J.Volume:
1994
Year:
1994
Language:
english
DOI:
10.1117/12.168213
File:
PDF, 164 KB
english, 1994