SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Ultrahigh- and High-Speed Photography, Videography, and Photonics '94 - Detailed measurements and shaping of gate profiles for microchannel-plate-based x-ray framing cameras
Landen, Otto L., Abare, Amber C., Hammel, Bruce A., Bell, Perry M., Bradley, David K., Kyrala, George A., Snyder, Donald R.Volume:
2273
Year:
1994
Language:
english
DOI:
10.1117/12.189033
File:
PDF, 462 KB
english, 1994