SPIE Proceedings [SPIE Optics for Productivity in...

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SPIE Proceedings [SPIE Optics for Productivity in Manufacturing - Frankfurt, Federal Republic of Germany (Sunday 19 June 1994)] Optical Measurements and Sensors for the Process Industries - Comprehensive optical diagnostics of IR-sensitive film structures

Stafeev, Sergey C., Gorecki, Christophe, Preater, Richard W. T.
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Volume:
2248
Year:
1994
Language:
english
DOI:
10.1117/12.194355
File:
PDF, 618 KB
english, 1994
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