SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Comparing digital-light-processing (DLP) and liquid-crystal-display(LCD) projection technologies for high-quality 3D shape measurement
Han, Sen, Yoshizawa, Toru, Zhang, Song, Gong, Chen, Li, Beiwen, Zhang, SongVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071536
File:
PDF, 1.05 MB
english, 2014