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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 13 February 2016)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII - Increasing the imaging depth through computational scattering correction (Conference Presentation)
Brown, Thomas G., Cogswell, Carol J., Wilson, Tony, Koberstein-Schwarz, Benno, Omlor, Lars, Schmitt-Manderbach, Tobias, Mappes, Timo, Ntziachristos, VasilisVolume:
9713
Year:
2016
Language:
english
DOI:
10.1117/12.2211718
File:
PDF, 114 KB
english, 2016