SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Machine Vision Applications, Architectures, and Systems Integration IV - Automatic plaque assay for the pharmaceutical industry using machine vision
Wilder, Joseph, Tsai, Augustine, Festa, J. M., Batchelor, Bruce G., Solomon, Susan S., Waltz, Frederick M.Volume:
2597
Year:
1995
Language:
english
DOI:
10.1117/12.223992
File:
PDF, 479 KB
english, 1995