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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and EUV/FUV Spectroscopy and Polarimetry - Sensitivity to x-ray polarization of a microgap gas proportional counter
Soffitta, Paolo, Costa, Enrico, Morelli, Ennio, Bellazzini, Ronaldo, Brez, Alessandro, Raffo, R., Fineschi, SilvanoVolume:
2517
Year:
1995
Language:
english
DOI:
10.1117/12.224922
File:
PDF, 814 KB
english, 1995