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SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology - Intelligent acquisition routines (IAR) in surface microtopography
Mainsah, E., Stout, Kenneth J., Descour, Michael R., Harding, Kevin G., Svetkoff, Donald J.Volume:
2599
Year:
1996
Language:
english
DOI:
10.1117/12.230382
File:
PDF, 389 KB
english, 1996