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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Wavelet Applications in Signal and Image Processing IV - Template basis techniques for pattern recognition
Lehr, Mark E., Lii, Keh-Shin, Unser, Michael A., Aldroubi, Akram, Laine, Andrew F.Volume:
2825
Year:
1996
Language:
english
DOI:
10.1117/12.255219
File:
PDF, 1.03 MB
english, 1996