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SPIE Proceedings [SPIE Intl. Conf. on Experimental Mechanics: Advances and Applications - Singapore, Singapore (Wednesday 4 December 1996)] International Conference on Experimental Mechanics: Advances and Applications - Microdeformation evolution properties of copper bicrystals by digital speckle correlation metrology
Wu, Xiaoping, Yu, Hengwen, Li, Xide, Hu, Xiaofang, Chau, Fook S., Lim, C. T.Volume:
2921
Year:
1997
Language:
english
DOI:
10.1117/12.269789
File:
PDF, 403 KB
english, 1997