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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Developments in X-Ray Tomography - Hard x-ray phase tomographic investigation of materials using Fresnel diffraction of synchrotron radiation
Peix, Gilles, Cloetens, Peter, Pateyron-Salome, Murielle, Buffiere, Jean-Yves, Baruchel, Jose, Peyrin, Francoise, Schlenker, Michel, Bonse, UlrichVolume:
3149
Year:
1997
Language:
english
DOI:
10.1117/12.279354
File:
PDF, 1.15 MB
english, 1997