![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Lasers and Materials in Industry and Opto-Contact Workshop - Quebec, Canada (Monday 13 July 1998)] Opto-Contact: Workshop on Technology Transfers, Start-Up Opportunities,and Strategic Alliances - IR ellipsometry for surface anisotropy measurement: applications to pulp and paper industry
Bernard, Pierre, Charlebois, Alain, Corriveau, Robert J. L., Soileau, M. J., Auger, MichelVolume:
3414
Year:
1998
Language:
english
DOI:
10.1117/12.323538
File:
PDF, 2.17 MB
english, 1998