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SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 28 September 1998)] Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Dependence of compositional profile and structural perfection of CdxHg1-xTe graded-gap films on its growing conditions
Antonov, V. S., Janikay, O. N., Korolyuk, S. L., Rarenko, A. I., Stetsko, Yu. P., Talyanskiy, E. B., Zakharuk, Z. I., Bodnaruk, Oksana O., Sizov, Fiodor F.Volume:
3890
Year:
1999
Language:
english
DOI:
10.1117/12.368412
File:
PDF, 503 KB
english, 1999