SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut,...

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SPIE Proceedings [SPIE Optoelectronic Metrology - Lancut, Poland (Monday 28 September 1998)] Optoelectronic Metrology - Ukrainian radiometric realization of the candela

Kupko, Alexander D., Nazarenko, Leonid A., Owsik, Jan, Wiecek, Tomasz
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Volume:
4018
Year:
1999
Language:
english
DOI:
10.1117/12.373743
File:
PDF, 258 KB
english, 1999
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