SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - CNN based visual processing for industrial inspection
Guinea, Domingo, Preciado, Victor M., Vicente, Jose, Ribeiro, Angela, Garcia-Alegre, Maria C., Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380086
File:
PDF, 625 KB
english, 2000