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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Ultrafast Phenomena in Semiconductors VI - Demonstration of high spatial resolution in ultrafast scanning tunneling microscopy
Yarotski, Dzmitry A., Donati, Giovanni P., Taylor, Antoinette J., Tsen, Kong-Thon F., Song, Jin-Joo, Jiang, HongxingVolume:
4643
Year:
2002
Language:
english
DOI:
10.1117/12.470421
File:
PDF, 412 KB
english, 2002