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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Interferometry XI: Applications - Optical tomography for smooth-changing refraction index distribution
de la Rosa Miranda, Enrique, Berriel-Valdos, Luis R., Funes-Gallanzi, Marcelo, Fernandez Orozco, S. A., Osten, WolfgangVolume:
4778
Year:
2002
Language:
english
DOI:
10.1117/12.473548
File:
PDF, 107 KB
english, 2002