SPIE Proceedings [SPIE Seventh International Symposium on...

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SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Laser measurements of the optical parameters of objectives in ultraviolet, visible, and infrared spectral regions

Bougayenko, Adolf G., Lukin, Anatoly V., Melnikov, Andrey N., Morozov, Anatoly E., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. Herbert
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Volume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484620
File:
PDF, 327 KB
english, 2002
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