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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Development of an autonomous scanning laser Doppler vibrometer vibration tracking method for inline quality control
Vanlanduit, Steve, Osten, Wolfgang, Kujawinska, Malgorzata, Cauberghe, Bart, Guillaume, Patrick, Creath, Katherine, Verboven, PeterVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.501236
File:
PDF, 688 KB
english, 2003