SPIE Proceedings [SPIE Lightmetry 2002 - Warsaw, Poland (Tuesday 14 May 2002)] Lightmetry 2002: Metrology and Testing Techniques Using Light - Frequency characteristics of gas lasers light used in interferometric systems
Pienkowski, Janusz, Pluta, Maksymilian, Szyjer, Mariusz, Rzepka, Janusz, Sambor, SlawomirVolume:
5064
Year:
2002
Language:
english
DOI:
10.1117/12.501518
File:
PDF, 268 KB
english, 2002