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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors - Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera
Lowney, Donnacha P., Tatchyn, Roman O., Chang, Zenghu, Heimann, Philip A., Gullikson, Eric M., Kieffer, Jean-Claude, Hastings, Jerome B., MacPhee, Andrew G., Falcone, Roger W., Padmore, Howard A.Volume:
5194
Year:
2003
Language:
english
DOI:
10.1117/12.503412
File:
PDF, 943 KB
english, 2003