SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Optical Manufacturing and Testing V - Self-calibration for microrefractive lens measurements
Gardner, Neil, Stahl, H. Philip, Randolph, Timothy, Davies, AngelaVolume:
5180
Year:
2003
Language:
english
DOI:
10.1117/12.506396
File:
PDF, 438 KB
english, 2003