SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Radioactive decay of excitations in ZnSe (Te)
Gordeev, S. I., Duparre, Angela, Singh, Bhanwar, Galkin, Sergey N., Kostyukevich, S. A., Lalayants, A. I., Ryzhikov, Vladimir D., Tolmachev, Alexander V., Voronkin, E. F., Lisetskaja, E. K.Volume:
5188
Year:
2003
Language:
english
DOI:
10.1117/12.508381
File:
PDF, 116 KB
english, 2003
File converter
More search results
More benefits 
