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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Nonlinear pattern recognition for the quality control of chips on circuit boards
Perreault, Steeve, Arsenault, Henri H., Bergeron, Alain, Iancu, Ovidiu, Manea, Adrian, Cojoc, DanYear:
2012
Language:
english
DOI:
10.1117/12.519638
File:
PDF, 917 KB
english, 2012