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SPIE Proceedings [SPIE 19th Congress of the International Commission for Optics: Optics for the Quality of Life - Firenze, Italy (Sunday 25 August 2002)] 19th Congress of the International Commission for Optics: Optics for the Quality of Life - Novel method for optical characterization of thin films by spectrophotometric measurements
Egio-Artal, Alfonso, Fernandez-Hidalgo, Pablo, Conde-Font, Oriol, Vilajuana-Mas, Toni, Righini, Giancarlo C., Consortini, AnnaVolume:
4829
Year:
2003
Language:
english
DOI:
10.1117/12.530008
File:
PDF, 91 KB
english, 2003