SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - The application of digital tomosynthesis to the CT nondestructive testing of long large objects
Huang, Zhifeng, Bonse, Ulrich, Li, Zheng, Kang, KejunVolume:
5535
Year:
2004
Language:
english
DOI:
10.1117/12.558695
File:
PDF, 83 KB
english, 2004