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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Structural characterization of microcrystalline-amorphous hydrogenated silicon samples prepared by PECVD method
Orduna-Diaz, A., Rojas Lopez, M., Gayou, V. L., Delgado-Macuil, R. J., Mendez-Garcia, V. H., Perez-Blanco, R. E., Rosendo, E., Marcano O., Aristides, Paz, Jose LuisYear:
2012
Language:
english
DOI:
10.1117/12.591693
File:
PDF, 149 KB
english, 2012