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SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Research on SVMs of small samples on rotary machine multiclass fault recognition
Gu, Xiaojun, Fang, Jiancheng, Wang, Zhongyu, Yang, Shixi, Qian, Suxiang, Yang, JiangxinVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.717613
File:
PDF, 262 KB
english, 2006