SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on demodulating wide range off-centering of distributed FBG by AWG
Wan, Xu, Zhang, Yudong, Wyant, James C., Peng, BaoJin, Shen, YaQiang, Smythe, Robert A., Wang, Hexin, Jin, HongZhenVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828793
File:
PDF, 367 KB
english, 2008