SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging - Laser scattering properties of the rough ellipsoidal object with the random facet model
Guo, Jing, Amzajerdian, Farzin, Gao, Chun-qing, Yang, Chun-ping, Kang, Mei-ling, Xie, Tian-yu, Zhang, Yan, Wu, JianVolume:
7382
Year:
2009
Language:
english
DOI:
10.1117/12.835019
File:
PDF, 270 KB
english, 2009