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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Single-image based dimensions inspection technology for planar industrial parts
Chen, Ji-hua, Ye, Shenghua, Zhang, Guangjun, Jiang, Yan-yun, Ni, JunVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.837650
File:
PDF, 1.56 MB
english, 2009