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SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Terahertz Technology and Applications III - Measurement and modeling of rough surface effects on terahertz spectroscopy
Henry, S. C., Sadwick, Laurence P., O'Sullivan, Creidhe M. M., Schecklman, S., Kniffin, G. P., Zurk, L. M., Chen, A.Volume:
7601
Year:
2010
Language:
english
DOI:
10.1117/12.841054
File:
PDF, 1.93 MB
english, 2010