SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Speckle characteristics of a laser projector using nonmodal laser emission of a semiconductor laser
Craggs, Gordon M. J., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Riechert, Falko, Meuret, Youri, Thienpont, Hugo, Danckaert, Jan, Lemmer, Uli, Verschaffelt, GuyVolume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.868299
File:
PDF, 1.48 MB
english, 2010