SPIE Proceedings [SPIE SPIE Remote Sensing - Prague, Czech Republic (Monday 19 September 2011)] Image and Signal Processing for Remote Sensing XVII - Characteristic analyses of the reflected components of IR signals due to multiple reflection on object surfaces
Kim, Dong-Geon, Bruzzone, Lorenzo, Choi, Jun-Hyuk, Kim, Tae-KukVolume:
8180
Year:
2011
Language:
english
DOI:
10.1117/12.897825
File:
PDF, 1.94 MB
english, 2011