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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, United States (Sunday 22 January 2012)] Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Implementing and using the EMVA1288 standard
Darmont, A., Widenhorn, Ralf, Nguyen, Valérie, Chahiba, J., Lemaitre, J. -F., Dupret, Antoine, Pirson, M., Dethier, D.Volume:
8298
Year:
2012
Language:
english
DOI:
10.1117/12.905874
File:
PDF, 534 KB
english, 2012