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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Calibration: Techniques, Sources, and Detectors - Optical Surface Evaluation By Soft X-Ray Scattering
Green, James C., Finley, David S., Bowyer, Stuart, Malina, Roger F., Lee, Ping, Rockett, Paul D.Volume:
689
Year:
1986
Language:
english
DOI:
10.1117/12.936571
File:
PDF, 478 KB
english, 1986