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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] Surface Characterization and Testing - Intensity Distribution In Out-Of-Focus Images Of A Rotationally Symmetric Optical System
Wong, Steve N., Parks, Robert E., Shao, Lianzhen, Creath, KatherineVolume:
680
Year:
1987
Language:
english
DOI:
10.1117/12.939594
File:
PDF, 1.49 MB
english, 1987