SPIE Proceedings [SPIE 1988 Los Angeles Symposium--O-E/LASE '88 - Los Angeles, CA (Monday 11 January 1988)] Image Processing, Analysis, Measurement, and Quality - Analysis And Measurement Of Resolution Of Shadow Mask CRT Displays
Veron, Harry, Hughes, Gary W., Mantey, Patrick E., Rogowitz, Bernice E.Volume:
901
Year:
1988
Language:
english
DOI:
10.1117/12.944718
File:
PDF, 276 KB
english, 1988