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SPIE Proceedings [SPIE 1988 Semiconductor Symposium - Newport Beach, CA (Monday 14 March 1988)] Spectroscopic Characterization Techniques for Semiconductor Technology III - Alloy Disorder Effects In Molecular Beam Epitaxically Grown AlxGa1-xAs Examined Via Raman And Rayleigh Scattering And Near Edge Luminescence
Lao, Pudong, Tang, Wade C., Madhukar, A., Chen, P., Glembocki, Orest J., Pollak, Fred H., Ponce, Fernando A.Volume:
946
Year:
1988
Language:
english
DOI:
10.1117/12.947424
File:
PDF, 242 KB
english, 1988