SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - Multilayer Theory Of X-Ray Reflection
Harper, P. G., Ramchurn, S. K., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964928
File:
PDF, 338 KB
english, 1986