Interpretation of X-ray photoelectron spectra of carbon-nitride thin films: New insights from in situ XPS
Hellgren, Niklas, Haasch, Richard T., Schmidt, Susann, Hultman, Lars, Petrov, IvanLanguage:
english
Journal:
Carbon
DOI:
10.1016/j.carbon.2016.07.017
Date:
July, 2016
File:
PDF, 1.30 MB
english, 2016