Comparative analysis of the intrinsic voltage gain and unit...

Solid-State Electronics 2016 / 09 Vol. 123

Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures

Oliveira, Alberto Vinicius de, Agopian, Paula Ghedini Der, Martino, Joao Antonio, Simoen, Eddy, Claeys, Cor, Collaert, Nadine, Thean, Aaron
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Volume:
123
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.05.004
Date:
September, 2016
File:
PDF, 1.14 MB
english, 2016
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