SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX - Performance of the XMM EPIC MOS CCD detectors
Short, Alexander T., Keay, Adam, Turner, Martin J. L., Siegmund, Oswald H. W., Gummin, Mark A.Volume:
3445
Year:
1998
Language:
english
DOI:
10.1117/12.330276
File:
PDF, 1.17 MB
english, 1998