SPIE Proceedings [SPIE SPIE's 27th Annual International...

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SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Advances in Resist Technology and Processing XIX - Resist develop prediction by Monte Carlo simulation

Sohn, Dong-Soo, Jeon, Kyoung-Ah, Sohn, Young-Soo, Oh, Hye-Keun, Fedynyshyn, Theodore H.
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Volume:
4690
Year:
2002
Language:
english
DOI:
10.1117/12.474172
File:
PDF, 223 KB
english, 2002
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