SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Etalon of optical frequency for the telecommunication spectral region
Lazar, Josef, Osten, Wolfgang, Takeda, Mitsuo, Ruzicka, Bohdan, Cip, OndrejVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.545714
File:
PDF, 1.84 MB
english, 2004