SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in Metrology for X-Ray and EUV Optics II - Hard x-ray wavefront measurement and control for hard x-ray nanofocusing
Handa, Soichiro, Assoufid, Lahsen, Takacs, Peter Z., Mimura, Hidekazu, Matsuyama, Satoshi, Ohtsuka, Masaru, Yumoto, Hirokatsu, Kimura, Takashi, Sano, Yasuhisa, Tamasaku, Kenji, Nishino, Yoshinori, YabVolume:
6704
Year:
2007
Language:
english
DOI:
10.1117/12.733749
File:
PDF, 386 KB
english, 2007